JEDEC

$40.00
METHODS OF MEASUREMENT FOR SEMICONDUCTOR LOGIC GATING MICROCIRCUITS JEDEC Solid State Technology Association / 01-Jan-1970 / 44 pages The purpose of this bulletin is to recommend for use in the rating of semiconductor logic gating microcircuits which use the binary states to represent and process logic information. Both static and dynamic measurements are covered.
$24.00
PREFERRED LEAD CONFIGURATION FOR FIELD-EFFECT TRANSISTORS JEDEC Solid State Technology Association / 01-Nov-1973 / 8 pages This publication indicates preferred pinouts for FETs in various package designs.
$33.50
TEST PROCEDURES FOR VERIFICATION OF MAXIMUM RATINGS OF POWER TRANSISTORS JEDEC Solid State Technology Association / 01-Dec-1967 / 25 pages This publication describes tests which are intended to represent the verification of maximum ratings for data sheets; they are not tests for performance or quality level. This material is to be used in conjunction with formats developed for device registration and defining data.
$33.50
LIFE TEST METHODS FOR PHOTOCONDUCTIVE CELLS JEDEC Solid State Technology Association / 01-Sep-1969 / 25 pages This publication is for photoconductive cells sensitive primarily in the visible and near infrared region.
$29.50
MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE JEDEC Solid State Technology Association / 01-Feb-1967 / 17 pages This standard gives a test method for measuring transistor capacitance using a three-terminal bridge which employs a guard-circuit that eliminates the effect of extraneous capacitance.
$31.00
STANDARD FOR THE MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS JEDEC Solid State Technology Association / 01-Apr-1976 / 23 pages This standard specifies the standard for the measurement of small-signal transistor scattering parameters. Formerly known as RS-435 and/or EIA-435
$27.00
MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE JEDEC Solid State Technology Association / 01-Jul-1972 / 14 pages This standard contains a three-terminal procedure for capacitance measurement with due precautions for shielding of extraneous effects due to terminal leads and metal enclosures. Formerly known as RS-398 and/or EIA-398
$25.50
THE MEASUREMENT OF TRANSISTOR EQUIVALENT NOISE VOLTAGE AND EQUIVALENT NOISE CURRENT AT FREQUENCIES OF UP TO 20 kHz JEDEC Solid State Technology Association / 01-Apr-1968 / 10 pages This standard provides a method for determining values, for device registration purposes, for transistor equivalent noise voltage and equivalent noise current at frequencies up to 20 kHz. This method is applicable to transistors whose noise has a Gaussian, flat (white) or I/f power distribution. Formerly known as...
$25.50
THE MEASUREMENT OF TRANSISTOR NOISE FIGURE AT FREQUENCIES UP TO 20 kHz BY SINUSOIDAL SIGNAL-GENERATOR METHOD JEDEC Solid State Technology Association / 01-Apr-1968 / 9 pages This noise measurement method applies to transistors whose noise has a Gaussian power distribution, to transistors whose noise has a flat (white) power distribution, and to transistors whose noise has a l/f (power inversely proportional to frequency) power distribution. Formerly known as RS-353 and/or EIA-353.
$27.00
STANDARD FOR THE MEASUREMENT OF CRE JEDEC Solid State Technology Association / 01-Nov-1967 / 13 pages This standard offers an easily measured parameter which is one of the significant characteristics in determining the stability of a transistor intended for small-signal operation. The measurement technique allows rapid testing. Its correlation to AC stability will help to establish the interchangeability of a device. Formerly known as RS-340 and/or EIA-340.
$28.00
THERMAL RESISTANCE MEASUREMENTS OF CONDUCTION COOLED POWER TRANSISTORS JEDEC Solid State Technology Association / 01-Oct-1975 / 15 pages This standard provides a test method for measuring thermal resistance for conduction cooled power transistors.
$24.00
MEASUREMENT OF SMALL SIGNAL HF, VHF, AND UHF POWER GAIN OF TRANSISTORS JEDEC Solid State Technology Association / 01-May-1965 / 7 pages This standard provides a method of measurement for small-signal HF, VHF, and UHF power gain of low power transistors. Formerly known as RS-306 and/or EIA-306.
$23.50
RANGES AND CONDITIONS FOR SPECIFYING BETA FOR LOW POWER, AUDIO FREQUENCY TRANSISTORS FOR ENTERTAINMENT SERVICE JEDEC Solid State Technology Association / 01-Jan-1965 / 6 pages This standard establishes the preferred rating ranges and conditions for specifying beta for low power, audio frequency transistors intended for entertainment service. Formerly known as RS-302 and EIA-302.
$24.00
TEST METHODS FOR THE COLLECTOR-BASE TIME CONSTANT AND FOR THE RESISTIVE PART OF THE COMMON-EMITTER INPUT IMPEDANCE JEDEC Solid State Technology Association / 01-Nov-1963 / 8 pages The test methods described in this Standard are generally applicable to alloy-like devices for which the usual simplified equivalent circuits can be employed. Formerly known as EIA-284-A (November 1963). Became JESD284-A when reaffirmed in October 2002.
$37.00
MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS JEDEC Solid State Technology Association / 01-Nov-1972 / 30 pages This standard provides a test method and definition for small-signal conditions at microwave frequencies.
$25.50
RECOMMENDED CHARACTERIZATION OF MOS SHIFT REGISTERS JEDEC Solid State Technology Association / 01-Nov-1972 / 10 pages This recommendation applies to MOS Shift Registers. Definitions are given for P-channel registers but are applicable to all CMOS and N-channel with changes in power supply notation.
$24.00
VOLTAGE REGULATOR DIODE NOISE VOLTAGE MEASUREMENT JEDEC Solid State Technology Association / 01-May-1965 / 7 pages This standard is intended to cover the measurement of noise voltage in voltage regulator diodes in the reverse breakdown region. It describes noise voltage measurements at specified conditions, but may be used as a guide for making such measurements at other than specified conditions. Formerly known as EIA-307.
$70.50
TERMINOLOGY AND METHODS OF MEASUREMENT FOR BISTABLE SEMICONDUCTOR MICROCIRCUITS JEDEC Solid State Technology Association / 01-Nov-1969 / 97 pages This bulletin explains the terminology and methods of measurement for bistable semiconductor microcircuits. It is also intended to be used with the EIA Registration Data Format for semiconductor integrated bistable logic circuits.
$29.50
PERFORMANCE TEST PROCEDURE FOR SOLAR CELLS AND CALIBRATION PROCEDURE FOR SOLAR CELL STANDARDS FOR SPACE VEHICLE SERVICE JEDEC Solid State Technology Association / 01-Nov-1969 / 18 pages The purpose of this standard is to classify the output of solar cells for space vehicle service in accordance with requirements of EIA Format JS4-RDF4.
$25.50
AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES JEDEC Solid State Technology Association / 01-Mar-1966 / 9 pages This standard is applicable to life testing of lead-mounted semiconductor devices intended for applications in a natural air-cooled environment where most of the power dissipation is obtained by convection and radiation losses from the body to the device.